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Изменения к шагу №3

Отредактированно Brittany McCrigler -

Правка одобрена автор Brittany McCrigler

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[* black] After pre-processing the chips are examined. It's best to see that your specimen is ready...
[* black] ...ready for the transmission electron microscope (TEM).
[* black] This bad boy is handy when you want to know transistor strain, gate oxide thicknesses, or crystal lattice orientation.
[* black] Like the ion blaster, the TEM uses the shoot-first-ask-questions-later method by blasting electrons at its prey to see how they get along.
[* black] We've had fun taking a tiny peek at Chipworks playground, but we've got to move on before the drool requires a series of keyboard replacements.